Rohde & Schwarz HZ-15.02 Probe Set for E and H Near-Field Emissions 30 MHz to 3 GHz

E and H Near-Field Emission Measurements with Test Receivers, Spectrum Analyzers and Oscilloscopes

Near-field measurements are often performed if, for example, a developer has to find out why an emission limit of an EMC standard is exceeded. Based on field strength measurements, the developer already knows several critical frequencies of the device or module under test. A practical way to reduce EMI is to analyze near fields, locate the sources and come up with targeted countermeasures. Furthermore, the passive near-field probes can also be used for immunity measurements.

Before you perform a near-field analysis, you first need to know how the E and H fields are distributed. The five probes from the R&S®HZ-15 probe set are well suited for this purpose. If only magnetic fields need to be analyzed, the R&S®HZ-17 probe set is sufficient.

All near-field probes are designed for ease of use, and are ideal for measuring high-frequency fields starting at 30 MHz on printed boards and on components.

The magnetic field probes include special electrically shielded probe tips. The various probe tip shapes are designed for tasks in near-field measurements. The upper limit frequency of a probe is determined by the size and design of the probe tip. All probes are passive and are connected to the 50 Ω input of a test receiver, spectrum analyzer or oscilloscope. The R&S®HZ-16 preamplifier increases sensitivity.

R&S HZ-15 near-field probe set with the R&S FPH spectrum analyzer and the R&S HZ-16 preamplifier.	R&S HZ-15 near-field probe set with the R&S RTO2064 oscilloscope.

The E field probes

E field probe RSE02
The surfaces of bus structures, large components or supply structures emit E fields that can cause EMI. The bottom of the RSE02 probe detects these fields on an area measuring approx. 2 cm × 5 cm.

E field probe RSE10
The narrow electrode of the RSE10 probe can select a single conductor track from a bundle of conductor tracks 0.2 mm in width. The light color of the probe tip stands out in sharp contrast to the dark green of the printed board.

H field probe RSH400-1

H field probe RSH400-1
Owing to its large diameter (approx. 25 mm), the RSH400-1 probe for H field is extremely sensitive and provides the average of the magnetic field strength in the loop area of the probe. You can use the probe at a 10 cm distance around modules and instruments.

H field probe RSH50-1
The RSH50-1 (diameter approx. 10 mm) is higher in resolution and lower in sensitivity than the RSH400-1. It is suitable for performing measurements at a smaller distance of up to approx. 3 cm. In this range, you can determine field distribution and field orientation even more precisely.

H field probe RSH2.5-2
The RSH2.5-2 H field probe can be used to selectively detect the current spectrum in conductor tracks and component leads such as on capacitors or ICs. The probe tip has a magnetically active groove of approx. 0.5 mm in width.