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EM-ISight is the first fully flexible EMI/EMC measurement system built on 5 or 6 axis articulated robots designed to support multiple applications and industries including networking, automotive, integrated circuits, aviation, military, and consumer products. Used as a compliance system for IEC-61967-1-6 or a pre-compliance / development tool, the abundance of features meet most requirements for research, design and analytical needs.
Custom applications can be developed by the user for EM-ISight allowing for a complete customized test platform. The footprint of the system means that it can be introduced to most measurement environments with multiple frequency range and robot sizes to choose from. The system can be housed in the optional mobile shield, and has an assessed noise floor (sensitivity) of below -139 dBm* when used with high end spectrum analyzers.
EM-ISight is an affordable and easy to use system with great return on investment when using the Far Field Approximation (FFA) module. It is a true alternative to costly pre-compliance EMC chambers which have high maintenance costs and use significant floor space. Integration of high end Low Noise Amplifiers at the core of the transmission line yield low insertion loss and high unwanted field rejection of better than 25dBm. Easy setup for measurement profiles (less than 60 seconds) using the optional camera and touch detection allow complex topologies of a PCB to be taught in real time.
Integration of 6 axis robots allows for measurements in traditional Cartesian or advanced Horizontal plains. Users can utilize a measurement frequency span of 10 kHz to 40 GHz using our proprietary single probe solution.
Applicable Standards IEC-61967-1-6 VCCI/CISPR 22/FCC Pt 15/22 EN55022 CISPR 12/FCC Pt 18/EN55011/ EN60555/VDE0871 EN55024/EN6100-6-4/GR-1089-CORE ITU-T/ETS300/ IEC-6100-3 | Applications Integrated Circuit/Printed Circuit Board Wireless modules De-Sense testing (receiver circuits) Medical devices Automotive and aviation Electronic device emissions Pre-Compliance testing (emissions/susceptibility) Quality control/audit Consumer products cell phone/computer devices Susceptibility / ESD |
Supported Spectrum Analyzers Tektronix | ![]() |
NOTE: Signal generator, spectrum analyzer is customer supplied.
Some applications require additional upgrades from a standard package spectrum analyzer; please confirm spectrum analyzer compatibility with APREL.
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FFA Tiled Volumes with Hotspot Markers | 4D Plot with Interpolated Grid and 3D Hotspot Marker |
Custom mobile shields available for purchase with EM-ISight Systems
Description | Perform EM Near-field scanning on a PCB, IC, LCD, RFID tag, wireless module, or antenna’s for quality control and design optimization, pre-test and certification | ||||||||||||||||||||||||||||
Software | Windows XP, Vista, Win 7 and MAC Boot Camp User friendly GUI that allows for easy setup and data retrieval Automatic antenna probe movement control Automatic system control or user definable parametric setup Visual display including storage and retrieval of measured results in full 3/4D Data tracking for project improvement/quality control Importation of previous measurement profiles to track design/quality improvements | ||||||||||||||||||||||||||||
Applications | Perform EM Test - measurements of (near-field) magnetic fields emitted by a DUT, including RF circuit, PCB and IC EM field values measured using an optional spectrum analyzer and presented in 2D/3D/4D form via PC Typical applications include, EMI noise emission analysis Shielding placement/optimization PCB board or IC design optimization/placement Antenna design optimization RF-Immunity/emitted radiation analysis of mobile handset LCD or LCD controllers Optional Susceptibility and ESD test modules | ||||||||||||||||||||||||||||
Typical Probe Measuring Unit |
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Measuring Reach and Movement |
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DUT Orientation |
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System Control |
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General |
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Additional Features SW | Multiple plots recorded in single report Multiple layers on single measurement process Automated peak search Dynamic touch detection and vision control User defined plotting for multiple scan locations Limit exceed search function & User defined limit function Optional Far Field Approximation for EMC test equivalent sites of 3M and 10M Ubiquitous Server Application for custom development of test applications Automated data summary reporting AVI plotting over device or in 3/4D mode Remote access for database data retrieval and batch scanning process Multiple driver support for Anritsu, Agilent/Keysight, Rhode & Schwarz Spectrum Analyzers |
*Customer must specify at time of order (standard build is 110V)
6 Axis systems require 220V
Supported Spectrum Analyzer Models | |||
STANDARD 450mm | EXTENDED REACH 850mm | LONG REACH 1.2m | |
5 Axis | ✔ | ||
6 Axis | ✔ | ✔ | ✔ |
6 GHz | ✔ | ✔ | ✔ |
20 GHz | ✔ | ✔ | ✔ |
40 GHz | ✔ | ✔ | ✔ |
FFA | ✔ | ✔ | ✔ |
USA | ✔ | ✔ | ✔ |
Vertical Scanning * | ✔ | ✔ | ✔ |
*For 6 axis model only. |