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Over-the-Air (OTA) Test Chambers
- EMC Test Equipment
- Transient Generators
- RF Power Amplifiers
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- Pulse Amplifiers
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- Manufacturers
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- Haefely CDN's (Coupling/Decoupling Networks)
- IFI Amplifiers
- Keysight (Agilent)
- MVG - Microwave Vision Group
- PMM / Narda
- Rohde & Schwarz RF Test Equipment
- Rohde & Schwarz Broadband RF Amplifiers
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- Schloder
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- Schwarzbeck Antennas
- Solar Electronics
- Teseq (Schaffner)
- Teseq Automotive Transient Generators
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- Teseq EFT/Burst Generators
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- Teseq ESD Guns
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- Teseq Dips, Interrupts & Variations Equipment
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- Teseq Absorbing Clamps / Ferrite Tube
- Teseq EMC Antennas
- Teseq Current Probes
- Teseq Coupling Networks
- Thermo Keytek
- Vicreate
- Compliance Standards
- International (IEC/EN)
- EN/IEC 61000-3-2
- EN/IEC 61000-3-3
- IEC 61000-3-11
- IEC / EN 610000-3-12
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- EN/IEC 61000-4-8
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- EN/IEC 61000-4-10
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- EN/IEC 61000-4-12
- EN/IEC 61000-4-16
- EN/IEC 61000-4-18
- EN/IEC 61000-4-19
- EN/IEC 61000-4-20
- EN/IEC 61000-4-21
- EN/IEC 61000-4-29
- EN/IEC 61000-4-31
- IEC 61000-4-39
- EN/IEC 62132
- SEMI F47 Voltage Sag Immunity
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- FCC Part 30
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- Application/Test Type
- Radiated Immunity
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- RF Emissions Testing
- Conducted Immunity
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- Antenna Pattern Measurement
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- Pulsed HIRF Radar
- Over-the-Air (OTA) Testing
- 5G Test Solutions
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- SAR Measurement Equipment
- Radiated Emissions
- Battery Simulator Test Equipment
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Viewed products
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General Test Systems...
19GHz ~ 50GHz (extensible) RF...
-
EM Test PFM 200N100.1...
Switch for Power supply (100 A) and...
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General Test Systems MW60 mmWave Chipset OTA Measurement System
New
- 19GHz ~ 50GHz (extensible)
- RF Performance measurement of MMW chipset (AIP) & antenna arrays
- Compact portable OTA measurement system
- Support low and high temperature (-45 °C ~ 115°C) test after expanding
The EMC Shop
Test Equipment Description
VSG: Design for SG waveform-modulated signal. Communicate with high-precision probe antennas.
VSA: Analyze and calculate signal quality, evaluate RF performance of DUT.
MaxSign100: Realize visual data by reading information from instrument directly and built-in calibration method to array antenna.
Integrated controller: Switch signal, control turntable and integrate system instrument through ports.
MMW Chamber: Realize high-precision OTA test by providing low-reflected measurement environment.
Measurement Probe
- VSWR<1.6 (Typical)
- Gain>16dB (Typical)
- 3dB beam width<30°
- Port/polarization Isolation >30dB
System Overview
| Specifications | |
| Frequency Rage | 19GHz ~ 50GHz (extensible) |
| Application | MMV phase aaray antenna measurement; MMW chipset (AIP) measurement |
| Items | -RF Performace: EVM, PER, ACLR, SFDR --45°C high-low temperature (optional) |
| Shielding degree | > 60dN |
| Distance | 680mm |
| Reflected level of QZ | <-35dB |
| Pattern accuracy | ±0.1dB |
| Size (max) | 50mm |
| Weight (max) | 5kg |
| X/Y Shaft Travel | ±25mm |
| Speed (max) | 50mm/systemAccuracy: ±0.005mm |
| Size | 900mm x 800mm x 1000mm (LxWxH) |
| Door | 900mm x 600mm (WxH) |
| Absorber | |
| Frequency | 33GHz 24GHz 26GHz 28GHz 30GHz 32GHz 34GHz 36GHz 38GHz 40GHz |
| Reflection | -43dB -43dB -45dB -45dB -45dB -46dB -46dB -42dB -49dB -50dB |
| Material | EPP (expanded polypropylene) |
| Height | 60mm |
| Hygroscopicity | 0.02% |
| OI | 27.8% |
| Operating Temperature | -45°C ~ 115°C |
| Service life | 30years |
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General Test Systems MW150 OTA Test Solution for mmW Antenna Array