Over-the-Air (OTA) Test Chambers

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General Test Systems MW60 mmWave Chipset OTA Measurement System

New

  • 19GHz ~ 50GHz (extensible)
  • RF Performance measurement of MMW chipset (AIP) & antenna arrays
  • Compact portable OTA measurement system
  • Support low and high temperature (-45 °C ~ 115°C) test after expanding

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Test Equipment Description

VSG: Design for SG waveform-modulated signal. Communicate with high-precision probe antennas.

VSA: Analyze and calculate signal quality, evaluate RF performance of DUT.

MaxSign100: Realize visual data by reading information from instrument directly and built-in calibration method to array antenna.

Integrated controller: Switch signal, control turntable and integrate system instrument through ports.

MMW Chamber: Realize high-precision OTA test by providing low-reflected measurement environment.

Measurement Probe

  • VSWR<1.6 (Typical)
  • Gain>16dB (Typical)
  • 3dB beam width<30°
  • Port/polarization Isolation >30dB

System Overview

Specifications
Frequency Rage19GHz ~ 50GHz (extensible)
ApplicationMMV phase aaray antenna measurement; MMW chipset (AIP) measurement
Items-RF Performace: EVM, PER, ACLR, SFDR
--45°C high-low temperature (optional)
Shielding degree> 60dN
Distance680mm
Reflected level of QZ<-35dB
Pattern accuracy±0.1dB
Size (max)50mm
Weight (max)5kg
X/Y Shaft Travel±25mm
Speed (max)50mm/systemAccuracy: ±0.005mm
Size900mm x 800mm x 1000mm (LxWxH)
Door900mm x 600mm (WxH)
Absorber
Frequency33GHz 24GHz 26GHz 28GHz 30GHz 32GHz 34GHz 36GHz 38GHz 40GHz
Reflection-43dB -43dB -45dB -45dB -45dB -46dB -46dB -42dB -49dB -50dB
MaterialEPP (expanded polypropylene)
Height60mm
Hygroscopicity0.02%
OI27.8%
Operating Temperature-45°C ~ 115°C
Service life30years

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