MVG / Satimo StarLab Antenna Pattern Measurement System for OTA Testing

StarLab is the ultimate tool for antenna pattern measurements in laboratories and production environments where space is limited, cost is critical, and the flexibility of a portable system is required.

MV-ScanTM Technology is integrated into all our multi-probe systems. With MV-ScanTM, an array of probes is electronically scanned, increasing measurement speed while also gaining in measurement accuracy. It’s also smart technology that allows for choices in confi gurations in order to limit mechanical movements

Fast The need for faster measurement of antennas and radomes is a growing concern in the industry. Not only do our customers want to test signifi cant numbers of beams at once, they want to test more frequently and in a short amount of time. Optimizing ROI is essential. The electronic scanning of an array of ten to hundreds of probes using MV-ScanTM allows the measurement of a full cut in quasi-real time.

High levels of accuracy and repeatability remain an absolute necessity for the needs of increasingly complex testing. We are able to ensure measurement accuracy of our systems as a result of several complementary factors.

• Precise knowledge of our systems’ error budget
• Comparison studies
• Reduction of mechanical movements
• Continuous probe calibration

The use of probe-arrays reduces the number of probe/DUT positions necessary to complete a test. This results in fewer mechanical movements. In addition, we offer a choice of geometries as well as different types of arrays to allow you to attain the most effi cient confi guration. Mechanical movements are thus minimized and speed and accuracy are maximized