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Ringwave 0.5 μs/100 kHz Pulse conforms to IEC/EN 61000-4-12 and ANSI (IEEE) C62.41 | |
Parameter | Value |
Pulse voltage (open circuit) | 0.20 – 7.8kV ±10% |
Test duration | 5 seconds |
Impedance | 12, 30 & 200 Ohms |
Polarity | Positive. negative, alternating |
Pulse repetition | 12 per minute |
Phase synchronization | 1° steps ±1° @50Hz |
IEC 61000-4-12 and ANSI C62.41 describe a Ring Wave generator for application on power lines in a protected environment. ANSI C62.41 specifies the ring wave for testing products situated in Location Category A and B. The standard differentiates between the two categories by detailing different effective impedances of 30 and 12 ohms respectively. IEC 61000-4-12 applies the same criteria as ANSI but adds a 200 ohm source impedance and includes the testing of input/output ports.
Safety is paramount with surge impulses. The Haefely PIM 110 High Voltage connections are all linked into the System Safety Concept which prevents high voltage plugs or cables from exposing operators to potentially lethal voltages. This concept is extended to Coupling/Decoupling Networks (CDNs) connected to the PIM 110 output.
The PIM 110 as part of the PSURGE 8000 Surge Platform System can be used together with Coupling/Decoupling Networks (CDNs) for superimposition of the impulse on AC and DC power lines. Single and three phase CDNs have multiplexed inputs, allowing up to 3 impulse modules to be connected. A full suite of test impulses can then be performed completely automatically and without the need to power down and reconnect the EUT.
PSURGE 8000 Surge Platform can perform all the programming functions required to perform IEC and ANSI testing without the need of a control computer. Voltage and Current monitor circuits enable quick and easy verification of the impulse shape and amplitude. In addition, peak measurement circuits are used to help determine EUT PASS/FAIL criterion. The s integration in the WinFEAT&R control and reporting software package an enhances efficient set-up and operation of this test system. Most importantly, the test load can be transferred to a computer freeing valuable resources.