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Teseq MD 4070...
As required in IEC/EN 61000-4-6...
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Teseq MD 4070 Monitoring Device 10 kHz to 400 (600) MHz
New
- As required in IEC/EN 61000-4-6
- Suitable for BCI testing per ISO 11452-4, RTCA/DO-160 section 20, MIL-STD-461 and various automotive standards
- Active/passive operation for wide dynamic range
- Suitable for NSG 4070
- Ruggedly designed
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Test Equipment Description
The monitoring device MD 4070 can be used as an active or passive current sensor probe to measure the current in a conductor without connecting it directly. The MD 4070 allows fast and easy measurement as it can be quickly clamped around the current carrying conductor.
The MD 4070 is characterized over the frequency range from 10 kHz to 400 (600) MHz. The MD 4070 can be used for the procedure for clamp injection when the common-mode impedance requirements cannot be met given in chapter 7.4 of IEC/EN 61000-4-6 „Immunity to conducted disturbances, induced by radio frequency fields”. The MD 4070 can also be used as current monitor for BCI testing as per ISO 11452-4, RTCA/DO-160 section 20, MIL-STD-461 and various automotive standards.
Features & Specifications of Teseq MD 4070:
| Parameter | Value |
|---|---|
Frequency range | 10 kHz to 400 (600) MHz |
Insertion loss | typical approx. -22 dB |
Transfer impedance | typical approx. 4 Ω (100 kHz to 230 MHz) |
Frequency response 100 kHz to 230 MHz | ±1.5 dB |
Frequency response 40 kHz to 400 MHz | typical +1.5 dB / -5 dB |
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