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The A300-2 Set consits of two sensors, which allow for displaying oscilloscopically analog signals under EFT/ESD/RF interference potential free. Disturbed signals can be easily detected. In the device under test the sensor transforms the measured logic signals into optical signals. The optical signals are transmitted via a fibre optical cable to the optical receiver which transforms them into electrical signals. These can be presented with an oscilloscope or can be used for controlling other devices. The system is suitable for monitoring signals or devices under test in an anechoic chamber or for EMC optimizing of hard-and software. For signal detecting within the device under test several sensor types AS300 or AS350 with different measuring ranges are available.
2x AE 300, Optical Receiver
2x AS 300, Optical Sensor, Analog ± 10 V DC
2x LWL Ø 2.2 mm 6 m, Optical Fibre, Single 6 m
1x NT FRI EU, Power Supply Unit
1x A300-2 acc, Accessories
1x A300-2 case, System Case
1x Analog m, User Manual
Technical Parameters | |
Bandwidth | DC ... 5 MHz |
Sampling rate | 12.5 Msps |
Resolution | 10 Bit |
AE 300 Optical Receiver | |
Bandwidth | DC ... 5 MHz |
Voltage range - output | ±1 V |
Optical input: Optical fiber | Ø 2.2 mm |
Supply voltage | 12 V ... 16 V |
Current input | ≈ 90 mA |
AS 300 Optical Sensor | |
Bandwidth | DC ... 5 MHz |
Sampling rate | 12.5 Msps |
Measuring range | ± 10 V |
Input resistance | 100 kΩ |
Radiated immunity | > 200 V/m |
Supply voltage | 4.5 V ... 16 V |
Current input | 70 mA (4.5 V) 30 mA (16 V) |
Optical fibre length | 1 ... 20 m |
Measurement under interference conditions
Measurement of analogue electrical signals under extreme electromagnetic stress such as:
EMC tests as the main field of application:
Measured signals:
Specific measurement technology:
To measure analogue signals under extreme interference conditions, measurement technology is needed that
The A100 set / A200 set / A300 set optical fibre measurement systems meet these demands.
Specific measuring task
Analogue electronic modules are generally influenced in EMC tests when RF, modulated by 1 kHz, is applied to the EUT. This influence is due to the fact that the infiltrated RF disturbance is demodulated at PN junctions of the electronic circuit. This generates signal level fluctuations or 1 kHz disturbance signals. The 1 kHz disturbance signal is produced through modulation of the RF disturbance by 1 kHz.
Relatively slow disturbance signals with a fundamental wave of 1 kHz, which mostly interfere with analogue circuits, are charac-teristic for RF disturbance coupling.
Figures 1 to 6, on the next page, show examples of useful signals that were subjected to disturbances. The deviation of the signal form from the sine wave varies, i.e. the disturbance signal also contains a harmonic component as well as the fundamental one. The task is to correctly measure these relatively slow disturbance signals under extreme RF interference conditions.
The A100 set / A200 set / A300 set measurement systems are ideal for these conditions because of their high disturbance immunity.
Examples of disturbed useful signals
Signals were measured with the AS 100 optical fibre probe.
Radiated RF emissions: 250 MHz, 80 % amplitude-modulated by 1 kHz
EUT: operational amplifier circuit; RF coupling via an operational amplifier input; the disturbance signal was measured on the output.
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Figure 1 The oscillogram shows a constant useful signal with a demodulated 1 kHz component. | Figure 2 The demodulated 1 kHz disturbance signal, superimposed on the useful signal, shows a large harmonic component. |
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Figure 3 The demodulated 1 kHz disturbance signal is limited by the lower rail. | Figure 4 Useful signal without interference. |
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Figure 5 Useful signal with 1 kHz disturbance signal. | Figure 6 Useful signal with 1 kHz disturbance signal limited by the upper rail. |
When using a product from Langer EMV-Technik GmbH, please observe the following safety instructions to protect yourself from electric shock or the risk of injuries.
Read and follow the instructions in the user manual and keep it in a safe place for later reference. The device may only be used by personnel who are qualified in the field of EMC and who are fit to work with and possibly be influenced by disturbance voltages and (electric and magnetic) burst fields.
Attention! Functional near fields and interference emissions may occur when the probe is operated. The user is responsible for taking appropriate precautions to prevent any interference with the correct function of products outside the operational EMC environment (in particular through interference emissions).
This can be achieved by:
The disturbances that are injected into the modules can destroy the device under test (latch-up) if their intensity is too high. Protect the device under test by:
Attention! Make sure that internal functional faults are visible from outside. The device under test may be destroyed due to an increase in the injection intensity if the faults are not visible from outside.
Take the following precautions if necessary:
We cannot assume any liability for the destruction of devices under test!
Langer EMV-Technik GmbH will remedy any fault due to defective material or defective manufacture, either by repair or by delivery of spare parts, during the statutory warranty period.
This warranty is only granted on condition that:
The warranty will be forfeited if: