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EM Test TSS 500N4 Telecom Surge Generator as per ITU / FCC up to 4 kV View larger

EM Test TSS 500N4 Telecom Surge Generator as per ITU / FCC up to 4 kV

New

  • Standalone tester for 10/700 µs pulse as per IEC 61000-4-5
  • Complies to ITU-T
  • Complies to FCC part 68 (Surge B pulses)
  • Built-in CDNs for 2-wire and 4-wire applications
  • Manual operation
  • Standard Test routines
  • USB and GPIB interface

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Specifications

Voltage Rating160 V - 4,000 V ±10%
Standards MetIEC 61000-4-5 ITU-T K.17 ITU-T K.20 ITU-T K.28 ITU-T K.45 (and more)
AC Power AdapterSupply voltage 115/230 V +10/-15%
Dimensions19"/3HU
Weightapprox. 20 kg (44 lbs.)

Test Equipment Description

EM Test TSS 500N4 Application:

Telecommunication networks are exposed to lightning events. Therefore telecommunications equipment being connected to the outside world need to have appropriate protection to show an acceptable immunity to surge transients in order not to fail in case of lightning events. Telecom Surge simulators of the TSS 500N-series are used to proof the immunity of telecommunications equipment.
The TSS 500N4 is used to perform tests as per IEC 61000-4-5 and related standards and complies with the requirements of ITU-T and FCC 97-270 (part 68) for Surge B pulse.

EM Test TSS 500N4 Standards Met:

  • EN 60950-1
  • EN 61000-4-5
  • FCC 97-270 (part 68)
  • IEC 60065
  • IEC 60950-1
  • IEC 61000-4-5
  • ITU-T K.17
  • ITU-T K.20
  • ITU-T K.28
  • ITU-T K.45

EM Test TSS 500N4 Benefits:

The Em Test TSS 500N4 is a compact tester to generate the Telecom Surge pulses 10/700 µs and 9/720 µs as well as the 1.2/50µs Voltage Surge pulse.

The TSS 500N4 is not just the pulse generator but it comes with the built-in coupling networks for 2-wire and 4-wire test applications. The outputs can directly be connected to the Telecom ports of the DUT. For testing Telecom lines EM TEST offers the appropriate coupling networks for 4-wire or 8-wire lines.
Pre-programmed Standard Test routines allow highest user convenience. Still the TSS 500N4 offers the Quick Start test routine where parameters can be changed on-line during the test to evaluate the susceptibility level of an individual DUT.
AS PER ITU AND ETS RECOMMENDATIONS
Pulse 1.2/50 μs
Voltage (o.c.)
160 V - 4,000 V ±10%
Rise time*)
1.0 μs ± 30%
Pulse duration*)
5
0 μs ± 20%
Energy storage
capacitor
1 μF
Pulse 10/700 μs
Rise time*)
6.5μs ± 30%
Pulse duration*)
700 μs ± 20%
Energy storage
capacitor
20 μF
Polarity
Positive, negative or alternating
Counter
1 - 30,000 or endless
*) definition of waveform parameters as per IEC 60469-1. As per IEC
61000-4-5 this is considered to be equal to the waveform parameter definition as per IEC 60060-1 for the 1.2/50μs pulse and CCITT for the 10/700μs pulse.
AS PER FCC PART 68, PULSE B
Voltage (o.c.)
160 V - 4,000 V ±10%
Front Time9 μs ± 30%
Decay time
720 μs ± 20%
Current (s.c.)
4 A - 100 A
Front time
5 μs ± 30%
Decay time
320 μs ± 20%
Energy storage capacitor
20 μF
Polarity
Positive, negative or alternating
Counter
1 - 30,000 or endless
AS PER IEC 61000-4-5
Pulse 10/700μs
Voltage (o.c.)
160 V - 4,000 V ±10%
Rise time*)
6.5 μs ± 30%
Pulse duration*)
700 μs ± 20%
Current (s.c.)
4 A - 100 A
Rise time*)
5 μs ± 20%
Pulse duration*)
320 μs ± 20%
Energy storage
capacitor
20 μF

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