EN/IEC 61000-4-4

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Teseq NSG 3060-ITU...
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Teseq NSG 3060-ITU Turn-Key Transient Generator for Surge, Telecom, EFT/Burst, IEC and ITU-T.K

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Teseq NSG 3060-ITU Turn-Key Transient Generator for Surge, Telecom, EFT/Burst, IEC and ITU-T.K

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Complies with and exceeds requirements of IEC/EN 61000-4-4, -5, and ITU-T.K series
Surge Combination Wave 6.6 kV
Surge Telecom 10/700 7.7 kV
EFT/Burst 4.8 kV
7.2" color display, touch panel, wheel with step size keys, Start-Stop-Pause keys and virtual keypad for easy and intuitive testing

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Teseq NSG 3060-ITU Turn-Key Transient Generator for Surge, Telecom, EFT/Burst, IEC and ITU-T.K
Complies with and exceeds requirements of IEC/EN 61000-4-4, -5, and ITU-T.K series
Surge Combination Wave 6.6 kV
Surge Telecom 10/700 7.7 kV
EFT/Burst 4.8 kV
7.2" color display, touch panel, wheel with step size keys, Start-Stop-Pause keys and virtual keypad for easy and intuitive testing
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Specifications

Pulse voltage (open circuit)	±200 V to 6.6 kV (in 1 V steps)
Combination wave pulse 1, 2/50 - 8/20 μs (Hybrid-Surge pulse) Pulse conforms to IEC/EN 61000-4-5
Parameter	Value
Impedance	2/12 Ω
Pulse current (short circuit)	±100 A to 3.3 kA
Coupling	ANSI / IEC / external
Repetition time	1 ms to 4200 s (70 min)
Pulse repetition	5* to 20 s, up to 600 s (in 1 s steps) * derated depending on selected pulse voltage and EUT supply voltage
Phase synchronization	asynchronous, synchronous 0 to 359º (in 1º steps)
Polarity	positive / negative / alternate
Phase synchronization	asynchronous, synchronous 0 to 359º (in 1º steps)
Coupling	ANSI / IEC / external
Test duration	1 to 9999 pulses, continuous
Test duration	1 s to 1000 h
Burst (EFT) 5/50 ns Pulse conforms to IEC/EN 61000-4-4
Parameter	Value
Pulse amplitude	±200 V to 4.8 kV (in 1 V steps) - open circuit; ±100 V to 2.4 kV (50 Ω matching system)
Burst frequency	100 Hz to 1000 kHz
Polarity	positive / negative / alternate
Burst time	1 μs to 1999 s, single pulse, continuous
Telecom Surge As per FCC part 68, Pulse B, IEC 61000-4-5, ITU and ETSI recommendations
Parameter	Value
Test Voltage	200 to 7.7 kV
Output Current	5 to 500 A
Repetition Rate	10 to 600 s
Transfer Impedance	15 and 40 Ω

Test Equipment Description

Teseq NSG 3060-ITK Features:

Teseq’s NSG 3060-ITU generator is an easy-to-use multifunction generator that simulates electromagnetic interference effects for immunity testing in conformity with international, national and manufacturers’ standards including the latest IEC/EN standards. The NSG 3060-ITU system is designed to fulfill conducted EMC test requirements for CE mark testing, ANSI TIA 968B, and ITU T. K series, including Combination Wave Surge (6.6 kV), Telecom Surge 10/700 (7.7 kV), and Electrical Fast Transient (EFT) pulses.

Featuring an innovative modular design, the NSG 3060-ITU is a versatile system that can be configured for basic testing needs and expanded to meet the needs of sophisticated test laboratories. Teseq’s well proven “Master-Slave” architecture enables individual pulse modules to be calibrated separately, with calibration data and correction factors stored on the slave controller. New modules can be easily installed with no need to return the entire system for calibration.