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IEC/EN 61000-4-5 & ANSI C62.45:...

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Rent Teseq NSG 3060 for Surge, EFT/Burst, Dips/Interrupts, and Ring Wave up to 6.6 kV

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IEC/EN 61000-4-5 & ANSI C62.45: Surge Combination Wave 6.6 kV
IEC/EN 61000-4-12 & ANSI C62.41: Surge Ring Wave 6.6 kV
IEC/EN 61000-4-4: EFT/Burst 4.8 kV
IEC/EN 61000-4-11 & IEC/EN 61000-4-29: Dips Interrupts and Variations
Built in Single Phase 16 Amp CDN
7.2" color display, touch panel, wheel with step size keys, Start-Stop-Pause keys and virtual keypad for easy and intuitive testing

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Rent Teseq NSG 3060 for Surge, EFT/Burst, Dips/Interrupts, and Ring Wave up to 6.6 kV
IEC/EN 61000-4-5 & ANSI C62.45: Surge Combination Wave 6.6 kV
IEC/EN 61000-4-12 & ANSI C62.41: Surge Ring Wave 6.6 kV
IEC/EN 61000-4-4: EFT/Burst 4.8 kV
IEC/EN 61000-4-11 & IEC/EN 61000-4-29: Dips Interrupts and Variations
Built in Single Phase 16 Amp CDN
7.2" color display, touch panel, wheel with step size keys, Start-Stop-Pause keys and virtual keypad for easy and intuitive testing
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Specifications

Pulse voltage (open circuit)	±200 V to 6.6 kV (in 1 V steps)
Combination wave pulse 1, 2/50 - 8/20 μs (Hybrid-Surge pulse) Pulse conforms to IEC/EN 61000-4-5
Parameter	Value
Impedance	2/12 Ω
Pulse current (short circuit)	±100 A to 3.3 kA
Coupling	ANSI / IEC / external
Repetition time	1 ms to 4200 s (70 min)
Pulse repetition	10* s, up to 600 s (in 1 s steps) * see datasheet for derating info
Phase synchronization	asynchronous, synchronous 0 to 359º (in 1º steps)
Polarity	positive / negative / alternate
Coupling	ANSI / IEC / external
Phase synchronization	asynchronous, synchronous 0 to 359º (in 1º steps)
Dips, Interrupts & Variations Conforms to IEC/EN 61000-4-11, IEC/EN 61000-4-29
Parameter	Value
Dips, Interrupts & Variations	From EUT voltage input to 0 V, 0%
Test duration	1 to 9999 pulses, continuous
Test duration	1 s to 1000 h
Uvar with step transformer	0, 40, 70, 80% (INA 650x)
Peak inrush current capability	500 A (at 230 V)
Burst (EFT) 5/50 ns Pulse conforms to IEC/EN 61000-4-4
Parameter	Value
Pulse amplitude	±200 V to 4.8 kV (in 1 V steps) - open circuit; ±100 V to 2.4 kV (50 Ω matching system)
Burst frequency	100 Hz to 1000 kHz
Polarity	positive / negative / alternate
Uvar with optional variac	depending on model (VAR 3005)
Ringwave 0.5 μs/100 kHz Pulse conforms to IEC/EN 61000-4-12 and ANSI (IEEE) C62.41
Parameter	Value
Pulse voltage (open circuit)	± 200 V to 6.6 kV (in 1 V steps)
Switching times	1 to 5 μs (100 Ω load)
Event time	20 µs to 1999 s, 1 to 300 cycles or 1 to 3’000 1/10 cycles
Test duration	1 s to 70’000 min, 1 to 99’999 events, continuous
Repetition time	40 μs to 35 min, 1 to 99’999 cycles
Test duration	1 to 9999 pulses, continuous
Pulse current (short circuit)	±16.6 to ±550 A, ±10%; ±6.6 to ±220 A, ±10%; ±1 to ±33 A, ±10%
Impedance	12/30/200 Ω
Polarity	positive / negative / alternate
Pulse repetition	10* s, up to 600 s (in 1 s steps) * see datasheet for derating info
Phase synchronization	asynchronous, synchronous 0 to 359º (in 1º steps)
Phase synchronization	asynchronous, synchronous 0 to 359º (in 1º steps)
Coupling	ANSI / IEC / external
Burst time	1 μs to 1999 s, single pulse, continuous

Test Equipment Description

The Teseq NSG 3060 Modular Transient Generator For Conducted Immunity Testing is an easy-to-use multifunction generator that simulates electromagnetic interference effects for immunity testing in conformity with international, national and manufacturers’ standards including the latest IEC/EN standards. The Teseq NSG 3060 system is designed to fulfill conducted EMC test requirements for CE mark testing and ANSI C62.41, including Combination Wave Surge (6.6 kV), Electrical Fast Transient (EFT) pulses (4.8 kV), Ring Wave (6.6 kV), and Power Quality Testing (PQT). Expansion capabilities enable the system to be configured for a much broader range of applications including Telecom Surge 10/700 and Magnetic Field tests.

Teseq NSG 3060 Features:

IEC/EN 61000-4-5 & ANSI C62.45: Surge Combination Wave 6.6 kV
IEC/EN 61000-4-12 & ANSI C62.41: Surge Ring Wave 6.6 kV
IEC/EN 61000-4-4: EFT/Burst 4.8 kV
IEC/EN 61000-4-11 & IEC/EN 61000-4-29: Dips Interrupts and Variations
Built in Single Phase 16 Amp CDN
7.2" color display, touch panel, wheel with step size keys, Start-Stop-Pause keys and virtual keypad for easy and intuitive testing

Featuring an innovative modular design, the Teseq NSG 3060 is a versatile system that can be configured for basic testing needs and expanded to meet the needs of sophisticated test laboratories. Teseq’s well proven “Master-Slave” architecture enables individual pulse modules to be calibrated separately, with calibration data and correction factors stored on the slave controller. New modules can be easily installed with no need to return the entire system for calibration.

Depending on your exact testing needs, different models are available to ensure the NSG 3060 is configured to your exact testing requirements.