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Rent Teseq NSG 3060 for Surge, EFT/Burst, Dips/Interrupts, and Ring Wave up to 6.6 kV View larger

Rent Teseq NSG 3060 for Surge, EFT/Burst, Dips/Interrupts, and Ring Wave up to 6.6 kV

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Specifications

Pulse voltage (open circuit)±200 V to 6.6 kV (in 1 V steps)
Impedance2/12 Ω
Combination wave pulse 1, 2/50 - 8/20 μs (Hybrid-Surge pulse)
Pulse conforms to IEC/EN 61000-4-5
ParameterValue
Pulse current (short circuit)±100 A to 3.3 kA
CouplingANSI / IEC / external
Repetition time1 ms to 4200 s (70 min)
Pulse repetition10* s, up to 600 s (in 1 s steps) * see datasheet for derating info
Polaritypositive / negative / alternate
Phase synchronizationasynchronous, synchronous 0 to 359º (in 1º steps)
CouplingANSI / IEC / external
Phase synchronizationasynchronous, synchronous 0 to 359º (in 1º steps)
Dips, Interrupts & Variations
Conforms to IEC/EN 61000-4-11, IEC/EN 61000-4-29
ParameterValue
Dips, Interrupts & VariationsFrom EUT voltage input to 0 V, 0%
Test duration1 to 9999 pulses, continuous
Test duration1 s to 1000 h
Uvar with step transformer0, 40, 70, 80% (INA 650x)
Peak inrush current capability500 A (at 230 V)
Burst (EFT) 5/50 ns
Pulse conforms to IEC/EN 61000-4-4
ParameterValue
Pulse amplitude±200 V to 4.8 kV (in 1 V steps) - open circuit; ±100 V to 2.4 kV (50 Ω matching system)
Burst frequency100 Hz to 1000 kHz
Polaritypositive / negative / alternate
Uvar with optional variacdepending on model (VAR 3005)
Ringwave 0.5 μs/100 kHz
Pulse conforms to IEC/EN 61000-4-12 and ANSI (IEEE) C62.41
ParameterValue
Pulse voltage (open circuit)± 200 V to 6.6 kV (in 1 V steps)
Switching times1 to 5 μs (100 Ω load)
Event time20 µs to 1999 s, 1 to 300 cycles or 1 to 3’000 1/10 cycles
Test duration1 s to 70’000 min, 1 to 99’999 events, continuous
Repetition time40 μs to 35 min, 1 to 99’999 cycles
Test duration1 to 9999 pulses, continuous
Pulse current (short circuit)±16.6 to ±550 A, ±10%; ±6.6 to ±220 A, ±10%; ±1 to ±33 A, ±10%
Impedance12/30/200 Ω
Polarity positive / negative / alternate
Pulse repetition10* s, up to 600 s (in 1 s steps) * see datasheet for derating info
Phase synchronizationasynchronous, synchronous 0 to 359º (in 1º steps)
Phase synchronizationasynchronous, synchronous 0 to 359º (in 1º steps)
CouplingANSI / IEC / external
Burst time1 μs to 1999 s, single pulse, continuous

Test Equipment Description

The Teseq NSG 3060 Modular Transient Generator For Conducted Immunity Testing is an easy-to-use multifunction generator that simulates electromagnetic interference effects for immunity testing in conformity with international, national and manufacturers’ standards including the latest IEC/EN standards. The Teseq NSG 3060 system is designed to fulfill conducted EMC test requirements for CE mark testing and ANSI C62.41, including Combination Wave Surge (6.6 kV), Electrical Fast Transient (EFT) pulses (4.8 kV), Ring Wave (6.6 kV), and Power Quality Testing (PQT). Expansion capabilities enable the system to be configured for a much broader range of applications including Telecom Surge 10/700 and Magnetic Field tests.

Teseq NSG 3060 Features:


Featuring an innovative modular design, the Teseq NSG 3060 is a versatile system that can be configured for basic testing needs and expanded to meet the needs of sophisticated test laboratories. Teseq’s well proven “Master-Slave” architecture enables individual pulse modules to be calibrated separately, with calibration data and correction factors stored on the slave controller. New modules can be easily installed with no need to return the entire system for calibration.

Depending on your exact testing needs, different models are available to ensure the NSG 3060 is configured to your exact testing requirements.

Rental Teseq NSG 3060 Includes

  • Teseq NSG 3060 Mainframe with 6kV Surge, 4kV EFT and Voltage Dips
  • Interlock Connectors
  • Single Phase Coupling/Decoupling Network
  • EUT Power Cable
  • AC Mains
  • User Manual
  • Calibration Documentation

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