Surge, Burst/EFT, Ring Wave, Dips & Interrupts

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Teseq NSG 3040-IEC...
Rent the Teseq NSG 3040-IEC System...

Teseq NSG 3040-IEC Test System for Surge Combination Wave, EFT/Burst, Dips Interrupts & Variations w/ Single Phase 16 A CDN

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Teseq NSG 3040-IEC Test System for Surge Combination Wave, EFT/Burst, Dips Interrupts & Variations w/ 16 A CDN

Condition Used

Rent the Teseq NSG 3040-IEC System
Includes PQM 3403 module to perform interrupt tests
Fully IEC 61000-4-2, -4, -5 compliant
Fully IEC 61000-4-11 & -4-29 compliant
16 A single phase CDN
Multi-function generator for immunity testing in compliance with EN/IEC 61000-4-4,5,11,29 for single phase testing up to 270 V/16 A.
Up to 4.4kV Surge and 4.8kV EFT/Burst testing

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Teseq NSG 3040-IEC Test System for Surge Combination Wave, EFT/Burst, Dips Interrupts & Variations w/ 16 A CDN
Rent the Teseq NSG 3040-IEC System
Includes PQM 3403 module to perform interrupt tests
Fully IEC 61000-4-2, -4, -5 compliant
Fully IEC 61000-4-11 & -4-29 compliant
16 A single phase CDN
Multi-function generator for immunity testing in compliance with EN/IEC 61000-4-4,5,11,29 for single phase testing up to 270 V/16 A.
Up to 4.4kV Surge and 4.8kV EFT/Burst testing
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Specifications

Supply Voltage	85 to 265 VAC, 50 / 60 Hz
Pulse voltage (open circuit)	±200 V to 4.4 kV (in 1 V steps)
Impedance	2/12 Ω
Combination wave pulse 1, 2/50 - 8/20 μs (Hybrid-Surge pulse) Pulse conforms to IEC/EN 61000-4-5
Parameter	Value
Pulse current (short circuit)	±100 A to 2.2 kA
Coupling	Integrated single phase CDN: 264 V AC / 16 A, 220 V DC / 10 A
Pulse repetition	10 s, up to 600 s (in 1 s steps)
Polarity	pos / neg / alternate
Phase synchronization	asynchronous, synchronous 0 to 359º (in 1º steps)
Dips, Interrupts & Variations Conforms to IEC/EN 61000-4-11, IEC/EN 61000-4-29
Parameter	Value
Dips, Interrupts & Variations	From EUT voltage input to 0 V, 0%
Test duration	1 s to 70’000 min, 1 to 99’999 events, continuous
Test duration	1 to 9999 pulses, continuous
Uvar with step transformer	depending on model (VAR 650x) 0, 40, 70, 80% (INA 650x)
Peak inrush current capability	500 A (at 230 V)
Burst (EFT) 5/50 ns Pulse conforms to IEC/EN 61000-4-4
Parameter	Value
Pulse amplitude	±200 V to 4.8 kV (in 1 V steps) - open circuit ±100 V to 2.4 kV (50 Ω matching system)
Burst frequency	100 Hz to 1000 kHz
Polarity	positive / negative / alternate
Counter	unlimited
Internal Data Memory	unlimited
Dimensions	449 (17.7”) x 226 (8.9”; 5 HU) x 565 mm (22.2”) (W x H x D)
Weight	approx. 29 kg (64 lbs)
Display Interface	7“ touch-screen
USB Input	Yes

Test Equipment Description

Teseq NSG 3040-IEC Description:

The Teseq NSG 3040 multifunction generator for CE mark testing, including Combination Wave Surge (4.4 kV), Electrical Fast Transient (EFT) pulses (4.8 kV) and Power Quality Testing (PQT). Expansion capabilities enable the system to be configured for a much broader range of applications including Telecom Surge 10/700 and Magnetic Field tests.